共 50 条
- [23] Formation, optical properties and electronic structure of thin Yb silicide films on Si(111) FUNDAMENTAL PROBLEMS OF OPTOELECTRONICS AND MICROELECTRONICS II, 2005, 5851 : 373 - 380
- [24] Dynamical Observation of H-induced Gate Dielectric Degradation through Improved Nuclear Reaction Analysis System 2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2016,