Investigation of near-stoichiometric polycrystalline CuInSe2 thin films by photoreflectance spectroscopy

被引:4
|
作者
Levcenko, S. [1 ]
Stange, H. [1 ,2 ]
Choubrac, L. [1 ]
Greiner, D. [3 ]
Heinemann, M. D. [3 ]
Mainz, R. [1 ]
Unold, T. [1 ]
机构
[1] Helmholtz Zentrum Mat & Energie, Hahn Meitner Pl 1, D-14109 Berlin, Germany
[2] Tech Univ Berlin, Inst Werkstoffwissensch, D-10587 Berlin, Germany
[3] PVcomB Helmholtz Zentrum Berlin Mat & Energie, Schwarzschildstr 3, D-12489 Berlin, Germany
关键词
CRITICAL-POINT PARAMETERS; ELECTRONIC-STRUCTURE; CHALCOPYRITE; LAYERS; ELECTROREFLECTANCE; SEMICONDUCTORS; SPECTRUM; CUGASE2; BULK;
D O I
10.1063/1.5145208
中图分类号
O59 [应用物理学];
学科分类号
摘要
The bandgap of CuInSe2 thin film photovoltaic absorbers depends on the Cu content, although the nature of this dependence is still a matter of debate. While theoretical results predicted a widening or stable bandgap with decreasing Cu content, the few experimental data available point to a narrowing of the bandgap. Here, we apply photoreflectance spectroscopy at room temperature to near-stoichiometric polycrystalline CuInSe2/CdS heterojunctions with a lateral Cu gradient to analyze the electronic transitions in the vicinity of the fundamental absorption edge of CuInSe2 absorber as a function of Cu deficiency. The results indicate that the lowest bandgap transition at 1.02eV notably decreases by 20-30meV for slightly Cu deficient samples, strengthening the case for an association of a lower Cu content with a narrower bandgap. In contrast, the higher energy transition at 1.25eV does not show a redshift, which requires further theoretical explanation. Published under license by AIP Publishing.
引用
收藏
页数:6
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