Estimation of capability index based on bootstrap method

被引:22
|
作者
Choi, KC
Nam, KH
Park, DH
机构
[1] UNIV NEBRASKA,DEPT MATH & STAT,LINCOLN,NE 68588
[2] HALLYM UNIV,DEPT STAT,CHUNCHON,SOUTH KOREA
来源
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 09期
关键词
ABUSE; CPK; DISTRIBUTIONS;
D O I
10.1016/0026-2714(95)00211-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A process capability index C-pmk is recently proposed to measure the degree of process capability of a system. C-pmk is a generalized version of the existing indices C-p, C-pk, and C-pm, which have been studied extensively in the last few years. In this paper, we present the estimators of C-pmk and derive its asymptotic distribution. We also utilize the asymptotic variance of the estimator of C-pmk to derive the two-sided confidence interval for C-pmk based on a percentile-t bootstrap method. Our new confidence intervals are shown to outperform the ones based on the percentile and standard bootstrap method by simulation. Copyright (C) 1996 Elsevier Science Ltd
引用
收藏
页码:1141 / 1153
页数:13
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