Evaluation of the load impedance in coaxial cable via time-frequency domain reflectometry

被引:5
作者
Shin, YJ [1 ]
Powers, EJ [1 ]
Choe, TS [1 ]
Sung, SH [1 ]
Yook, JG [1 ]
Park, JB [1 ]
机构
[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul 120749, South Korea
来源
ADVANCED SIGNAL PROCESSING ALGORITHMS, ARCHITECTURES, AND IMPLEMENTATIONS XIII | 2003年 / 5205卷
关键词
time-frequency domain reflectomerty; time-frequency cross correlation function; cross time-frequency distribution function; load impedance;
D O I
10.1117/12.505379
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A new impedance measurement methodology based on time-frequency domain reflectometry (TFDR) is proposed. For the evaluation of the reflection coefficient in time-frequency domain reflectometry, the distortion of the reflected wave by the frequency-dependent attenuation is compensated which otherwise results in inaccurate impedance measurement. Also, the phase difference between the incident and reflected waveforms caused by the state of the load impedance is evaluated by the cross time-frequency distribution which provides time-frequency localized phase difference information. The proposed methodology is verified by a set of numerical electromagnectic simulation experiments and the results are compared with classical time domain reflectometry (TDR). Impedance measurement via time-frequency domain reflectometry is more accurate over a wider range of impedances than TDR.
引用
收藏
页码:38 / 46
页数:9
相关论文
共 9 条
  • [1] *AG TECHN CO LTD, 2002, AG TECHN IMP MEAS HD
  • [2] FURSE C, 2001, IEEE SPECTRUM FEB, P35
  • [3] KERNEL DESIGN FOR REDUCED INTERFERENCE DISTRIBUTIONS
    JEONG, JC
    WILLIAMS, WJ
    [J]. IEEE TRANSACTIONS ON SIGNAL PROCESSING, 1992, 40 (02) : 402 - 412
  • [4] Extraction of the frequency-dependent characteristic impedance of transmission lines using TDR measurements
    Kim, W
    Swaminathan, M
    Li, YL
    [J]. PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, : 191 - 197
  • [5] An assessment on the accuracy of time-domain reflectometry for measuring the characteristic impedance of transmission lines
    Paulter, NG
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (05) : 1381 - 1388
  • [6] Pozar D. M., 2009, MICROWAVE ENG
  • [7] Time-frequency domain reflectometry for smart wiring systems
    Shin, YJ
    Song, ES
    Kim, JW
    Park, JB
    Yok, JG
    Powers, EJ
    [J]. ADVANCED SIGNAL PROCESSING ALGORITHMS, ARCHITECTURES, AND IMPLEMENTATIONS XII, 2002, 4791 : 86 - 95
  • [8] Cross time-frequency distribution function
    Shin, YJ
    Powers, EJ
    Grady, WM
    Bhatt, SC
    [J]. ADVANCED SIGNAL PROCESSING ALGORITHMS, ARCHITECTURES, AND IMPLEMENTATIONS X, 2000, 4116 : 9 - 16
  • [9] SHIN YJ, 2003, P IEEE INSTR MEAS TE, P190