Versatile electronic speckle pattern interferometry

被引：0
|
作者：
Sirohi, RS [1 ]
机构：
[1] Natl Univ Singapore, Dept Mech & Prod Engn, Singapore 119260, Singapore
来源：
LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS | 1998年 / 3478卷
关键词：
speckle interferometry; electronic speckle pattern interferometry; speckle metrology;
D O I：
10.1117/12.312964
中图分类号：
O3 [力学];
学科分类号：
08 ; 0801 ;
摘要：
The gaper presents a configuration to record out-of-plane displacement component and slope simultaneously using Electronic Speckle pattern Interferometry (ESPI). The retrieval of information, however, is possible only by Fourier processing.
引用
收藏
页码：417 / 420
页数：4
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