Versatile electronic speckle pattern interferometry

被引：0

作者：

Sirohi, RS ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Mech & Prod Engn, Singapore 119260, Singapore

来源：

LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS | 1998年 / 3478卷

关键词：

speckle interferometry; electronic speckle pattern interferometry; speckle metrology;

D O I：

10.1117/12.312964

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

The gaper presents a configuration to record out-of-plane displacement component and slope simultaneously using Electronic Speckle pattern Interferometry (ESPI). The retrieval of information, however, is possible only by Fourier processing.

引用

页码：417 / 420

页数：4

共 6 条

[1] MEINLSCHMIDT P, SPIE MILESTONE MS, V132
[2] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY FOR SIMULTANEOUS MEASUREMENT OF OUT-OF-PLANE DISPLACEMENT AND SLOPE
MOHAN, NK
SALDNER, H
MOLIN, NE
[J]. OPTICS LETTERS, 1993, 18 (21) : 1861 - 1863
[3] SPECKLE AND SPECKLE-SHEARING INTERFEROMETERS COMBINED FOR THE SIMULTANEOUS DETERMINATION OF OUT-OF-PLANE DISPLACEMENT AND SLOPE
MOHANTY, RK
JOENATHAN, C
SIROHI, RS
[J]. APPLIED OPTICS, 1985, 24 (18) : 3106 - 3109
[4] PEDRINI G, IN PRESS APPL OPT
[5] Sirohi R S, 1993, SPECKLE METROLOGY
[6] Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)
Sirohi, RS
Burke, J
Helmers, H
Hinsch, KD
[J]. APPLIED OPTICS, 1997, 36 (23): : 5787 - 5791

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