Versatile electronic speckle pattern interferometry

被引：0

作者：

Sirohi, RS ^{[1
]}

机构：

[1] Natl Univ Singapore, Dept Mech & Prod Engn, Singapore 119260, Singapore

来源：

LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS | 1998年 / 3478卷

关键词：

speckle interferometry; electronic speckle pattern interferometry; speckle metrology;

D O I：

10.1117/12.312964

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

The gaper presents a configuration to record out-of-plane displacement component and slope simultaneously using Electronic Speckle pattern Interferometry (ESPI). The retrieval of information, however, is possible only by Fourier processing.

引用

页码：417 / 420

页数：4

共 6 条

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Sirohi R S, 1993, SPECKLE METROLOGY

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Sirohi, RS ;

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APPLIED OPTICS, 1997, 36 (23) :5787-5791

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