Three-phase inverters open-circuit faults diagnosis using an enhanced variational mode decomposition, wavelet packet analysis, and scalar indicators

被引:6
|
作者
Abdelkader, Rabah [1 ,2 ]
Cherif, Bilal Djamal Eddine [3 ]
Bendiabdellah, Azeddine [4 ]
Kaddour, Abdelhafid [4 ]
机构
[1] Univ Djilali Bounaama Khemis Miliana, Fac Sci & Technol, Dept Technol, Route Theniet El Had, Khemis Miliana 44225, Am Defla, Algeria
[2] Ind Technol CRTI, Res Ctr, POB 64, Algiers 16014, Algeria
[3] Univ Msila, Fac Technol, Dept Elect Engn, Msila, Algeria
[4] Univ Sci & Technol Oran MohamedBoudiaf USTO MB, Fac Elect Engn, Bir El Djir, Algeria
关键词
Inverter; IGBT; Fault diagnosis; Open-circuit; Wavelet packet analysis; VMD; Variance; Average; VOLTAGE-SOURCE INVERTER; POWER CONVERTER; TRANSFORM;
D O I
10.1007/s00202-022-01633-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is critical to accurately detect IGBT (Insulated Gate Bipolar Transistor) switch faults in order to ensure the reliability and robustness of three-phase inverters. In this work, a new approach for the enhancement of the IGBTs open-circuit faults of a three-phase diagnosis inverter is proposed. This approach is based on an Enhanced version of the Variational Mode Decomposition algorithm (EVMD) combined with wavelet packet analysis (WPA) and scalar indicators such as the average and variance value. Firstly, the three-phase current signals are denoised using an improved version of the denoising technique based on a WPA. Secondly, the denoised current signals are decomposed by EVMD algorithm into Band Limited Intrinsic Mode Functions (BLIMFs). Thirdly, BLIMFs that have the highest correlation coefficients with current signals are selected as useful modes. Fourthly, the variance of the BLIMFs that have the highest correlation coefficient among those selected is calculated in order to detect the faulty phase and, consequently, the faulty arm. Finally, the average of the BLIMF that has the lowest correlation coefficient among those selected for the faulty phase is calculated to localize the fault position in either the upper or the lower IGBTs of the faulty arm. The proposed approach is applied to experimental signals and the results obtained show well the efficiency of the performance of the proposed approach in the diagnosis of open-circuit faults.
引用
收藏
页码:4477 / 4489
页数:13
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