The effect of sol concentration on 0.6BiFeO3-0.4PbTiO3 thin films prepared by sol-gel method

被引:0
作者
Cai, Jinyu [1 ]
Yu, Shengwen [1 ]
Cheng, Jinrong [1 ]
Lu, Ya [1 ]
Meng, Zhongyan [1 ]
机构
[1] Shanghai Univ, Dept Elect Informat mat, Sch Mat Sci & Engn, Shanghai 200072, Peoples R China
来源
THIN FILM PHYSICS AND APPLICATIONS, SIXTH INTERNATIONAL CONFERENCE | 2008年 / 6984卷
关键词
thin films; dielectric properties; leakage current;
D O I
10.1117/12.792358
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A series of 0.6BiFeO(3)-0.4PbTiO(3) (BFO-PT) thin films were fabricated by sol-gel technique with sol concentrations varying from 0.2M to 0.4M. X-ray diffraction (XRD) and scanning electron microscope (SEM) were utilized to characterize the structure and morphology of the BFO-PT films. The crystallinity of the films is improved with increasing the BFO-PT sol concentration. The dielectric properties and leakage current density of BFO-PT films were measured. The dielectric constants of all films are reasonably stable and the dielectric losses are below 5%. Considerably lower leakage current density is obtained in our sol-gel films.
引用
收藏
页码:T9840 / T9840
页数:4
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