Multisensor data fusion via Gaussian process models for dimensional and geometric verification

被引:56
作者
Colosimo, Bianca Maria [1 ]
Pacella, Massimo [2 ]
Senin, Nicola [3 ]
机构
[1] Politecn Milan, Dip Meccan, I-20156 Milan, Italy
[2] Univ Salento, Dip Ingn Innovaz, I-73100 Lecce, Italy
[3] Univ Perugia, Dip Ingn, I-06125 Perugia, Italy
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2015年 / 40卷
关键词
Multisensor data fusion; Coordinate metrology; CMM; Structured light scanner; Gaussian process; Kriging; MACHINE;
D O I
10.1016/j.precisioneng.2014.11.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An increasing amount of commercial measurement instruments implementing a wide range of measurement technologies is rapidly becoming available for dimensional and geometric verification. Multiple solutions are often acquired within the shop-floor with the aim of providing alternatives to cover a wider array of measurement needs, thus overcoming the limitations of individual instruments and technologies. In such scenarios, multisensor data fusion aims at going one step further by seeking original and different ways to analyze and combine multiple measurement datasets taken from the same measurand, in order to produce synergistic effects and ultimately obtain overall better measurement results. In this work an original approach to multisensor data fusion is presented, based on the development of Gaussian process models (the technique also known as kriging), starting from point sets acquired from multiple instruments. The approach is illustrated and validated through the application to a simulated test case and two real-life industrial metrology scenarios involving structured light scanners and coordinate measurement machines. The results show that not only the proposed approach allows for obtaining final measurement results whose metrological quality transcends that of the original single-sensor datasets, but also it allows to better characterize metrological performance and potential sources of measurement error originated from within each individual sensor. (C) 2014 Elsevier Inc. All rights reserved.
引用
收藏
页码:199 / 213
页数:15
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