Development of a High Stability, Low Standby Power Six-Transistor CMOS SRAM Employing a Single Power Supply

被引:1
作者
Kobayashi, Nobuaki [1 ]
Enomoto, Tadayoshi [2 ]
机构
[1] Nihon Univ, Coll Sci Technol, Dept Precis Machinery Engn, 7-24-1 Narashinodai, Funabashi, Chiba 2748501, Japan
[2] Chuo Univ, Fac Sci & Engn, Dept Informat & Syst Engn, Bunkyo Ku, 1-13-27 Kasuga, Tokyo 1128551, Japan
来源
24TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC 2019) | 2019年
关键词
D O I
10.1145/3287624.3287748
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
We developed and applied a new circuit, called the "Self-controllable Voltage Level (SVL)" circuit, not only to expand both "write" and "read" stabilities, but also to achieve a low stand-by power and data holding capability in a single low power supply, 90-nm, 2-kbit, six-transistor CMOS SRAM. The SVL circuit can adaptively lower and higher the word-line voltages for a "read" and "write" operation, respectively. It can also adaptively lower and higher the memory cell supply voltages for the "write" and "hold" operations, and "read" operation, respectively. A Si area overhead of the SVL circuit is only 1.383 % of the conventional SRAM.
引用
收藏
页码:15 / 16
页数:2
相关论文
共 7 条
  • [1] An 8T-SRAM for variability tolerance and low-voltage operation in high-performance caches
    Chang, Leland
    Montoye, Robert K.
    Nakamura, Yutaka
    Batson, Kevin A.
    Eickemeyer, Richard J.
    Dennard, Robert H.
    Haensch, Wilfried
    Jamsek, Damir
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2008, 43 (04) : 956 - 963
  • [2] Hirabayashi O., 2009, INT SOL STAT CIRC C
  • [3] Nii K., 2011, ISDR 2011
  • [4] OHBAYASHI S, 2006, S VLSI CIRC, P17
  • [5] MATCHING PROPERTIES OF MOS-TRANSISTORS
    PELGROM, MJM
    DUINMAIJER, ACJ
    WELBERS, APG
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1989, 24 (05) : 1433 - 1440
  • [6] Piguest C., 2004, LOW POWER ELECT DESI
  • [7] A 3-GHz 70-Mb SRAM in 65-nm CMOS technology with integrated column-based dynamic power supply
    Zhang, K
    Bhattacharya, U
    Chen, ZP
    Hamzaoglu, F
    Murray, D
    Vallepalli, N
    Wang, Y
    Zheng, B
    Bohr, M
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (01) : 146 - 151