Co-diffusion thin layer of phosphorus and boron for preparation of silicon BSF solar cell
被引:1
作者:
Yu, WT
论文数: 0引用数: 0
h-index: 0
机构:
Shanghai Univ, Dept Mat Sci, Shanghai 201800, Peoples R ChinaShanghai Univ, Dept Mat Sci, Shanghai 201800, Peoples R China
Yu, WT
[1
]
Wei, GP
论文数: 0引用数: 0
h-index: 0
机构:
Shanghai Univ, Dept Mat Sci, Shanghai 201800, Peoples R ChinaShanghai Univ, Dept Mat Sci, Shanghai 201800, Peoples R China
Wei, GP
[1
]
机构:
[1] Shanghai Univ, Dept Mat Sci, Shanghai 201800, Peoples R China
来源:
FOURTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS
|
2000年
/
4086卷
关键词:
solar cell;
co-diffusion;
silicon;
gettering;
D O I:
10.1117/12.408413
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Co-diffusion processing is emerging as a promising simplified process for manufacture of terrestrial back surface field (BSF) solar cells. In this work, we present results about co-diffusion of two dopant elements (phosphorus and boron) in a single thermal cycle in order to form emitter and BSF thin layer simultaneously. According to the measured sheet resistance, it was found that uniform, stable and controllable diffusion layers on front and back surface of silicon wafer can be obtained with co-diffusion method. Using the co-diffusion method, some silicon back surface field (BSF) solar cells with an efficiency of more than 12% (at AMI) were prepared. The measurement results of minority carrier lifetime show that boron diffusion in back side of silicon wafer has a gettering effect on the p-n junction area and can improve the characteristics of solar cells.