Variable-length input Huffman coding for system-on-a-chip test

被引：125
作者：
Gonciari, PT [1 ]
Al-Hashimi, BM
Nicolici, N
机构：
[1] Univ Southampton, Elect Syst Design Grp, Dept Elect & Comp Sci, Southampton SO17 1BJ, Hants, England
[2] McMaster Univ, Computer Aides Design & Test Res Grp, Dept Elect & Comp Engn, Hamilton, ON L8S 4K1, Canada
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2003年 / 22卷 / 06期
关键词：
automated test equipment (ATE); embedded core testing; system-onia-chip (SOC); test data compression; test resource partitioning; test set encoding; test time reduction;
D O I：
10.1109/TCAD.2003.811451
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a new compression method for embedded core-based system-on-a-chip test. In addition to the new compression method, this paper analyzes the three test data compression environment (TDCE) parameters: compression ratio, area overhead, and test application time, and explains the impact of the factors which influence these three parameters. The proposed method is based on a new variable-length input Huffman coding scheme, which proves to be the key element that determines all the factors that influence the TDCE parameters. Extensive experimental comparisons show that, when compared with three previous approaches [1]-[3], which reduce some test data compression environment's parameters at the expense of the others, the proposed method is capable of improving on all the three TDCE parameters simultaneously.
引用
收藏
页码：783 / 796
页数：14
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