Stacked Nb-MoSi2-Nb Josephson junctions for AC voltage standards

被引：16
作者：
Dresselhaus, PD [1 ]
Chong, Y [1 ]
Benz, SP [1 ]
机构：
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2005年 / 15卷 / 02期
关键词：
digital-analog conversion; Josephson arrays; superconducting devices; superconducting films; thin film devices;
D O I：
10.1109/TASC.2005.849871
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Superconductor-normal metal-superconductor (SNS) Josephson junctions have proven to be a critical technology for voltage standards. NIST has used SNS junctions for both de and ac programmable voltage standards. Previous devices have used primarily PdAu as a normal-metal barrier material. In this paper we present measurements of circuits having MOSi2 barriers. Stacking enables the junctions to be packed more densely, thus increasing design flexibility and margins for the microwave circuits. In this work, measurements are presented from two and three-junction stacks for application to ac Josephson voltage standards, which show output voltage and distortion near our best previously published results.
引用
收藏
页码：449 / 452
页数：4
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