Strong-field double ionization of rare gases

被引：15

作者：

Chaloupka, JL ^{[1
]}

Lafon, R

DiMauro, LF

Agostini, P

Kulander, KC

机构：

[1] Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA

[2] Ctr Etud Saclay, SPAM, F-91191 Gif Sur Yvette, France

[3] Univ Calif Lawrence Livermore Natl Lab, TAMP, Livermore, CA 94551 USA

来源：

OPTICS EXPRESS | 2001年 / 8卷 / 07期

关键词：

D O I：

10.1364/OE.8.000352

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have studied the double ionization of helium and other rare gases using an electron-ion coincidence technique. With this scheme, the electron energy spectrum correlated to the creation of a doubly charged ion may be compiled. In all cases, the observed double ionization electron distributions are similar and enhanced at high energies, while the single ionization spectra exhibit distinct differences. (C) 2001 Optical Society of America.

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页码：352 / 357

页数：6

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