Investigation of Point Defects in Silica-based Optical Fibers by Cathodoluminescence

被引：0

作者：

Reghioua, I. ^{[1
]}

Girard, S. ^{[1
]}

Raine, M. ^{[2
]}

Alessi, A. ^{[1
]}

Di Francesca, D. ^{[1
]}

Fanetti, M. ^{[3
]}

Martin-Samos, L. ^{[3
]}

Richard, N. ^{[2
]}

Valant, M. ^{[3
]}

Boukenter, A. ^{[1
]}

Ouerdane, Y. ^{[1
]}

机构：

[1] Univ Lyon, Lab Hubert Curien, F-42000 St Etienne, France

[2] CEA, DAM, DIF, F-91297 Arpajon, France

[3] Univ Nova Gorica, Mat Res Lab, Vipavska 11c, Ajdovscina 5270, Slovenia

来源：

2016 16TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2016年

关键词：

Optical fibers; cathodoluminescence; radiation; point; defects; dosimetry; telecom; ABSORPTION; CENTERS; SIO2; GE; PHOSPHORUS; PREFORMS; GLASSES;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate the high potential of cathodoluminescence (CL) spectroscopy for the study of point defects in the main classes of optical fibers: Telecom-grade, radiation-hardened, and radiation sensitive. Canonical samples, differently doped in their core (Ge, P, N) or their cladding (F), have been investigated by CL using electrons of energy ranging from 5 to 30 keV. Advantages and limitation of the CL tool are discussed on the basis of the obtained experimental results.

引用

页数：5

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