Towards Polarization-resolved all-electronic THz-nanoscopy

被引：0

作者：

Schaeffer, Stephan ^{[1
]}

Wigger, Anna Katharina ^{[1
]}

Bolivar, Peter Haring ^{[1
]}

机构：

[1] Univ Siegen, High Frequency & Quantum Elect, D-57076 Siegen, Germany

来源：

2018 43RD INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2018年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report on a polarization resolving 600 GHz scattering-type THz nanoscope (THz-s-SNOM) based on independent all-electronic emitter and detector units. This system is capable of measuring the in-plane and out-of-plane near-field components independently from the polarization of the emitter. Polarization dependent approach curves with a high S/N are shown, experimentally verifying the polarization selectivity of our system for THz-nanoscopy applications.

引用

页数：2

共 4 条

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