IMAGING OF DEFECTS IN SEVERAL COMPLEX CONFIGURATIONS BY SIMULATION-HELPED PROCESSING OF ULTRASONIC ARRAY DATA

Advanced ultrasonic array techniques such as full matrix acquisitions provide considerable amount of data making possible by the use of suitable processing algorithms enhanced capability of defects imaging and therefore improved localization and sizing. In general the applied processing consists in a coherent summation of signals (synthetic focusing) based on a time of flight inverse matching. Such algorithms have been connected to forwards models allowing to image defects in realistically complex configurations. In this communication we present results obtained on defects detected through complex surfaces on defects detected by multiple ultrasonic paths (tip diffraction, corner effect, mode conversions). The performances of the technique are evaluated both on simulated and experimental results.