Three-dimensional electric-field mapping system using crystal principal axes electro-optic rotation

被引：8
|
作者：
Kuo, WK [1 ]
Tang, DT [1 ]
机构：
[1] Natl Formosa Univ, Dept Electroopt Engn, Huwei 63208, Yunlin, Taiwan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2005年 / 76卷 / 05期
关键词：
D O I：
10.1063/1.1903143
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This article presents three-dimensional electric-field mapping measurement system using crystal principal axes electro-optic rotation. An experimental system using a probe tip made of y-cut LiNbO3 crystal is constructed. The mapping measurement results for three directional electric fields on a test device are reported.
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收藏
页数：5
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