Comparison of IGBT Cycling Capabilities for Different AC/AC Topologies

被引：15

作者：

Wei, Lixiang ^{[2
]}

Lipo, Thomas A. ^{[1
]}

Lukaszewski, Richard A. ^{[2
]}

机构：

[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA

[2] Rockwell Automat, Mequon, WI 53092 USA

来源：

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 2010年 / 46卷 / 06期

关键词：

Mean time to failure; power cycle; zero-current switching; zero-voltage switching; MATRIX CONVERTER; VECTOR MODULATION; 3-PHASE;

D O I：

10.1109/TIA.2010.2070478

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper analyzes the insulated gate bipolar transistor (IGBT) power cycling capability for a dual-bridge matrix converter (DBMC) used as a motor drive and compares the result with the traditional dc/ac inverter and the conventional matrix converter (CMC). Two pulsewidth modulation (PWM) control methods for the DBMC are investigated. One is called zero-current PWM (ZCPWM), which allows zero current commutation of the rectifier side switches. The other is named zero-voltage PWM (ZVPWM), which generates zero-voltage switching in the inverter IGBT. It is found that the DBMC under the ZVPWM method shows much higher power cycling capabilities in the IGBT than that of the ZCPWM and the other two topologies. Moreover, by appropriately selecting the sequence of the ZVPWM and ZCPWM methods, the DBMC shows overall advantages on the sizing of the IGBT and the balancing of the thermal system. It is also shown that the IGBT applied in the DBMC inverter is easier to operate under higher switching frequency conditions.

引用

页码：2475 / 2483

页数：9

共 12 条

[1] Blasko V., 1999, Conference Record of the 1999 IEEE Industry Applications Conference. Thirty-Forth IAS Annual Meeting (Cat. No.99CH36370), P1423, DOI 10.1109/IAS.1999.801687
[2] Lifetime prediction and design of reliability tests for high-power devices in automotive applications
Ciappa, M
Carbognani, F
Fichtner, W
[J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2003, 3 (04) : 191 - 196
[3] FAILURE-MECHANISM MODELS FOR CYCLIC FATIGUE
DASGUPTA, A
[J]. IEEE TRANSACTIONS ON RELIABILITY, 1993, 42 (04) : 548 - 555
[4] *EUPEC CORP, 2005, DIM PROGR IPOSIM IGB
[5] Held M, 1997, 1997 INTERNATIONAL CONFERENCE ON POWER ELECTRONICS AND DRIVE SYSTEMS, PROCEEDINGS, VOLS 1 AND 2, P425, DOI 10.1109/PEDS.1997.618742
[6] Jussila M, 2003, IEEE POWER ELECTRON, P689
[7] Kolar JW, 2002, APPL POWER ELECT CO, P777, DOI 10.1109/APEC.2002.989333
[8] Schafmeister F, 2003, APPL POWER ELECT CO, P241
[9] Venturini M., 1980, P POWERCON
[10] Wei L, 2008, COST ANAL MICROSCALE

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