HIGH-VALUE CAPACITANCE MEASUREMENT BASED ON INDUCTIVE SHUNT

被引：0

作者：

Dai DongXue ^{[1
]}

He XiaoBing ^{[1
]}

Wang Wei ^{[1
]}

机构：

[1] Natl Inst Metrol, Beijing 100013, Peoples R China

来源：

2010 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS CPEM | 2010年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes a new high-value capacitance measurement method based on the inductive shunt. The method is used to measure capacitance from 10 mu F to 1mF, frequency from 100 Hz to 1 kHz.

引用

页码：422 / 423

页数：2