Humidity effects;
Electrical parameters degradation;
Stability of pentacene based TFTs;
Modeling;
FIELD-EFFECT TRANSISTORS;
CONTACT RESISTANCE;
ENVIRONMENTAL STABILITY;
VOLTAGE SHIFT;
PERFORMANCE;
SIMULATION;
DEVICE;
D O I:
10.1016/j.synthmet.2014.12.009
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
P-type organic thin-film transistors (OTFTs), in which the active semiconductor is made of pentacene with silicon dioxide as a gate insulator, were fabricated and characterized. The effects of humidity on the electrical characteristics of pentacene based thin-film transistors (pentacene-TFTs) in the linear and saturation regimes were investigated. We report the variation of the electrical parameters by relative humidity (RH) extracted from the experimental electrical characteristics current-voltage of pentacene-TFT devices. We show that the diffusion of water molecules (H2O), the creation of acceptor states due to the presence of oxygen and the formation of clusters in the pentacene active layer considerably affect the stability and the performances of pentacene-TFTs. The degradation of electrical parameters of the pentacene-TFTs under relative humidity (RH) can be recovered with a simple pumping under vacuum (3 x 10(-5) to 5 x 10(-5) mbar). We also show that the changes introduced by the effects of humidity are reversible. Moreover the pentacene-TFT presents an intensive response for a high relative humidity (RH = 57%), which could be used for a humidity detection device technology. (C) 2014 Elsevier B.V. All rights reserved.
机构:
Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, ItalyUniv Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Bolognesi, A
;
Berliocchi, M
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机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Berliocchi, M
;
Manenti, M
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机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Manenti, M
;
Di Carlo, A
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机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Di Carlo, A
;
Lugli, P
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机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Lugli, P
;
Lmimouni, K
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机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Lmimouni, K
;
Dufour, C
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h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
机构:
Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, ItalyUniv Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Bolognesi, A
;
Berliocchi, M
论文数: 0引用数: 0
h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Berliocchi, M
;
Manenti, M
论文数: 0引用数: 0
h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Manenti, M
;
Di Carlo, A
论文数: 0引用数: 0
h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Di Carlo, A
;
Lugli, P
论文数: 0引用数: 0
h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Lugli, P
;
Lmimouni, K
论文数: 0引用数: 0
h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy
Lmimouni, K
;
Dufour, C
论文数: 0引用数: 0
h-index: 0
机构:Univ Roma Tor Vergata, Fac Ingn, Dipartimento Ingn Elettron, I-00133 Rome, Italy