Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies

被引:5
作者
Chen, Wu-Hsin [1 ]
Jung, Byunghoo [1 ]
机构
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
来源
IEEE DESIGN & TEST OF COMPUTERS | 2010年 / 27卷 / 06期
基金
美国国家科学基金会;
关键词
AUTOMATIC-AMPLITUDE CONTROL; FREQUENCY-CALIBRATION TECHNIQUE; LOW-NOISE; VCO; SYNTHESIZER;
D O I
10.1109/MDT.2010.138
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Researchers described automatic frequency calibration and amplitude control techniques that relied on a negative feedback loop with a large emphasis on digitally assisted calibration. The researchers presented a self-healing phase-locked loop (PLL) repair approach and described simulations conducted during the course of exploring the design issues. The self-healing technique focused on minimizing performance deviation from the target value by using automatic calibration circuits in comparison with the traditional design methodology that dealt with worst-case scenarios and tried to shift the overall distribution to the high-performance side. The automatic calibration techniques relied on one common design methodology, such as a negative feedback loop using an integrated sensor and a difference detector.
引用
收藏
页码:18 / 25
页数:8
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