Doping, compensation, and photosensitivity of detector grade CdTe

被引:8
|
作者
Babentsov, V. [2 ]
Franc, J. [1 ]
Fauler, A. [3 ]
Fiederle, M. [3 ]
James, R. B. [4 ]
机构
[1] Charles Univ Prague, Inst Phys, Fac Math & Phys, CZ-12116 Prague, Czech Republic
[2] Inst Semicond Phys, UA-03028 Kiev, Ukraine
[3] Freiburger Mat Forschungszentrum, D-79104 Freiburg, Germany
[4] Brookhaven Natl Lab, Nonproliferat & Natl Secur Directorate, Upton, NY 11973 USA
关键词
D O I
10.1557/JMR.2008.0198
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We studied the resistivity, photosensitivity, photoluminescence, and surface photovoltage of CdTe crystals doped with Ge or Sri to extend our knowledge of the influence of the deep-donor level on compensation and afterglow effects. We demonstrated a strong correlation between photosensitivity caused by photoelectrons with Fermi-level variations near the Ge-Cd(0/2+) or Sn-Cd(0/2+) energy levels. Surface photovoltage measurements confirmed that when the concentration of residual acceptors varied along the direction of growth, then trapping conditions dramatically changed as a defect was converted from a neutral state to doubly charged positive one.
引用
收藏
页码:1751 / 1757
页数:7
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