Absolute positioning by multi-wavelength interferometry referenced to the frequency comb of a femtosecond laser

被引:81
作者
Wang, Guochao [1 ,2 ]
Jang, Yoon-Soo [2 ]
Hyun, Sangwon [2 ]
Chun, Byung Jae [2 ]
Kang, Hyun Jay [2 ]
Yan, Shuhua [1 ]
Kim, Seung-Woo [2 ]
Kim, Young-Jin [2 ]
机构
[1] Natl Univ Def Technol, Coll Mechatron Engn & Automat, Dept Instrument Sci & Technol, Changsha 410073, Hunan, Peoples R China
[2] Korea Adv Inst Sci & Technol, Dept Mech Engn, Ultrafast Opt Ultraprecis Grp, Taejon 305701, South Korea
基金
新加坡国家研究基金会;
关键词
DISTANCE MEASUREMENTS; LONG;
D O I
10.1364/OE.23.009121
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A multi-wavelength interferometer utilizing the frequency comb of a femtosecond laser as the wavelength ruler is tested for its capability of ultra-precision positioning for machine axis control. The interferometer uses four different wavelengths phase-locked to the frequency comb and then determines the absolute position through a multi-channel scheme of detecting interference phases in parallel so as to enable fast, precise and stable measurements continuously over a few meters of axis-travel. Test results show that the proposed interferometer proves itself as a potential candidate of absolute-type position transducer needed for next-generation ultra-precision machine axis control, demonstrating linear errors of less than 61.9 nm in peak-to-valley over a 1-meter travel with an update rate of 100 Hz when compared to an incremental-type He-Ne laser interferometer. (C) 2015 Optical Society of America
引用
收藏
页码:9121 / 9129
页数:9
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