A survey of control issues in nanopositioning

被引:857
作者
Devasia, Santosh [1 ]
Eleftheriou, Evangelos
Moheimani, S. O. Reza
机构
[1] Univ Washington, Dept Mech Engn, Seattle, WA 98195 USA
[2] IBM Corp, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
[3] Univ Newcastle, Sch Elect Engn & Comp Sci, Newcastle, NSW 2308, Australia
基金
美国国家科学基金会; 澳大利亚研究理事会;
关键词
actuators; atomic force microscopy; nano-positioning; nanotechnology; piezoelectric devices; position sensors; servo control;
D O I
10.1109/TCST.2007.903345
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Nanotechnology is the science of understanding matter and the control of matter at dimensions of 100 nm or less. Encompassing nanoscale science, engineering, and technology, nanotechnology involves imaging, measuring, modeling, and manipulation of matter at, this level of precision. An important aspect of research in nanotechnology involves precision control and manipulation of devices and materials at a nanoscale, i.e., nanopositioning. Nanopositioners are precision mechatronic systems designed to move objects over a small range with a resolution down to a fraction of an atomic diameter. The desired attributes of a nanopositioner are extremely high resolution, accuracy, stability, and fast response. The key to successful nanopositioning is accurate position sensing and feedback control of the motion. This paper presents an overview of nanopositioning technologies and devices emphasizing the key role of advanced control techniques in improving precision, accuracy, and speed of operation of these systems.
引用
收藏
页码:802 / 823
页数:22
相关论文
共 218 条
[11]   ACTIVE CONTROL OF FLEXIBLE SYSTEMS [J].
BALAS, MJ .
JOURNAL OF OPTIMIZATION THEORY AND APPLICATIONS, 1978, 25 (03) :415-436
[12]  
Ballato A, 1996, ULTRASON, P575, DOI 10.1109/ULTSYM.1996.584046
[13]   OPTICAL SCAN-CORRECTION SYSTEM APPLIED TO ATOMIC FORCE MICROSCOPY [J].
BARRETT, RC ;
QUATE, CF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (06) :1393-1399
[14]   Intelligence rules of hysteresis in the feedforward trajectory control of piezoelectrically-driven nanostagers [J].
Bashash, Saeid ;
Jalili, Nader .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2007, 17 (02) :342-349
[15]  
Ben Mrad R, 2001, IEEE ASME INT C ADV, P510, DOI 10.1109/AIM.2001.936515
[16]   PVPF control of piezoelectric tube scanners [J].
Bhikkaji, B. ;
Ratnam, M. ;
Moheimani, S. O. R. .
SENSORS AND ACTUATORS A-PHYSICAL, 2007, 135 (02) :700-712
[17]  
BHIKKAJI B, 2006, 4 IFAC S MECH SYST H
[18]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[19]  
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[20]   SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
SMITH, DPE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689