Comparative study on BIS thiourea cadmium acetate crystals using HRXRD, etching, microhardness, UV-visible and dielectric characterizations

被引：25

作者：

Ganesh, V. ^{[1
,2
]}

Reddy, Ch. Snehalatha ^{[1
]}

Shakir, Mohd ^{[3
,4
]}

Wahab, M. A. ^{[3
]}

Bhagavannarayana, G. ^{[4
]}

Rao, K. Kishan ^{[1
]}

机构：

[1] Kakatiya Univ, Dept Phys, Warangal 506009, Andhra Pradesh, India

[2] Ganapathy Engn Coll, Dept Phys, Warangal 506005, Andhra Pradesh, India

[3] Jamia Millia Islamia, Dept Phys, Crystal Growth Lab, New Delhi 110025, India

[4] Natl Phys Lab, Mat Characterizat Div, New Delhi 110025, India

来源：

PHYSICA B-CONDENSED MATTER | 2011年 / 406卷 / 02期

关键词：

Optical materials; Crystal growth; Defects; Mechanical properties; SINGLE-CRYSTALS; GROWTH;

D O I：

10.1016/j.physb.2010.10.061

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

< 1 1 1 > oriented bis thiourea cadmium acetate (BTCA) crystal of diameter 15 mm and length 45 mm was grown for the first time by the unidirectional Sankaranarayanan-Ramasamy (SR) method. The conventional and SR method grown BTCA crystals were characterized by using high-resolution X-ray diffraction (HRXRD), chemical etching, Vickers microhardness, UV-vis, dielectric studies and differential scanning calorimetry. The HRXRD analysis indicates that the crystalline perfection of SR method grown crystal is good without having any low angle internal structural grain boundaries. The transmittance of SR method grown BTCA is 14% higher than that of conventional grown crystal. The dielectric constant was higher and the dielectric loss was less in SR method grown crystal. The crystals grown by SR method possess less dislocation density and higher microhardness. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：259 / 264

页数：6

共 22 条

[1] CRYSTAL AND MOLECULAR STRUCTURE OF TRIS (THIOUREA) ZINC (2) SULPHATE [J].