Illumination Dependence of Reverse Leakage Current in Silicon Solar Cells

被引:13
作者
Clement, Carlos Enrico [1 ,2 ]
Singh, Jai Prakash [3 ]
Birgersson, Erik [1 ,2 ]
Wang, Yan [1 ]
Khoo, Yong Sheng [1 ]
机构
[1] Solar Energy Res Inst Singapore, Singapore 117574, Singapore
[2] Natl Univ Singapore, Dept Mech Engn, Singapore 117575, Singapore
[3] Natl Inst Solar Energy NISE, Gurugram 122003, India
来源
IEEE JOURNAL OF PHOTOVOLTAICS | 2021年 / 11卷 / 05期
基金
新加坡国家研究基金会;
关键词
Lighting; Computer architecture; Microprocessors; Sun; Mathematical model; Leakage currents; Electric breakdown; Breakdown; illumination; leakage current; light induced; SIMULATION; INTENSITY;
D O I
10.1109/JPHOTOV.2021.3088005
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
In the modeling of PV modules under shading and low illumination, a complete description of reverse bias behavior at the cell level is critical to understanding module response. This is particularly important when dealing with high voltage configurations such as tandem and shingled modules. Current simulation studies often do not account for the effects of incident light when dealing with operating voltages approaching cell breakdown. In this article, we investigate the illumination dependence of leakage current at the onset of breakdown in crystalline silicon solar cells. A study of the most popular cell technologies in the market today reveals a light induced effect under reverse bias that is prominent for p-type and small for n-type cells. Additionally, this effect is found to be larger in mono c-Si than multi c-Si cells. Because this phenomenon is not captured in current breakdown models such as Bishop's equation, we propose a split-cell model to describe partial shading in p-type cells. The outlined approach divides the cell into two parallel regions and is advantageous for its procedural simplicity as well as its ability to generalize effects from complex shading profiles.
引用
收藏
页码:1285 / 1290
页数:6
相关论文
共 50 条
  • [21] Origin of reverse leakage current in n-type nanocrystalline diamond/p-type silicon heterojunction diodes
    Ikeda, Tomohiro
    Teii, Kungen
    [J]. APPLIED PHYSICS LETTERS, 2009, 94 (07)
  • [22] Effect of illumination intensity on solar cells parameters
    Chegaar, M.
    Hamzaoui, A.
    Namoda, A.
    Petit, P.
    Aillerie, M.
    Herguth, A.
    [J]. TERRAGREEN 13 INTERNATIONAL CONFERENCE 2013 - ADVANCEMENTS IN RENEWABLE ENERGY AND CLEAN ENVIRONMENT, 2013, 36 : 722 - 729
  • [23] Solar power generation system for reducing leakage current
    Wu, Jinn-Chang
    Jou, Hurng-Liahng
    Hung, Chih-Yi
    [J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 2018, 105 (04) : 694 - 708
  • [24] Temperature dependence of photoconversion efficiency in silicon heterojunction solar cells: Theory vs experiment
    Sachenko, A. V.
    Kryuchenko, Yu. V.
    Kostylyov, V. P.
    Bobyl, A. V.
    Terukov, E. I.
    Abolmasov, S. N.
    Abramov, A. S.
    Andronikov, D. A.
    Shvarts, M. Z.
    Sokolovskyi, I. O.
    Evstigneev, M.
    [J]. JOURNAL OF APPLIED PHYSICS, 2016, 119 (22)
  • [25] On the reverse leakage current of Schottky contacts on free-standing GaN at high reverse biases
    Lei, Yong
    Su, Jing
    Wu, Hong-Yan
    Yang, Cui-Hong
    Rao, Wei-Feng
    [J]. CHINESE PHYSICS B, 2017, 26 (02)
  • [26] On the reverse leakage current of Schottky contacts on free-standing GaN at high reverse biases
    雷勇
    苏静
    吴红艳
    杨翠红
    饶伟锋
    [J]. Chinese Physics B, 2017, (02) : 407 - 409
  • [27] A note on the polarization dependence of leakage current in ferroelectric thin films
    Scott, JF
    [J]. INTEGRATED FERROELECTRICS, 1999, 23 (1-4) : 187 - 190
  • [28] Observation of Crystalline Defects Causing pn Junction Reverse Leakage Current
    Watanabe, T.
    Nakao, Y.
    Fujihira, K.
    Miura, N.
    Tarui, Y.
    Imaizumi, M.
    Oomori, T.
    [J]. SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 999 - 1002
  • [29] An empirical model of leakage current in poly-silicon TFTs
    Wu, W. J.
    Yao, R. H.
    Hu, Y. F.
    Li, S. H.
    [J]. AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2, 2007, : 540 - 544
  • [30] Leakage Current Analysis for Epitaxial Silicon Pulse Radiation Detector
    Liu, Jiale
    Yu, Min
    Zhao, Xinyang
    Wang, Jingxi
    Yang, Fangdong
    [J]. 17TH IEEE INTERNATIONAL CONFERENCE ON IC DESIGN AND TECHNOLOGY (ICICDT 2019), 2019,