Inspection of refractive x-ray lenses using high-resolution differential phase contrast imaging with a microfocus x-ray source

被引：22
作者：
Engelhardt, Martin [1 ]
Baumann, Joachim
Schuster, Manfred
Kottler, Christian
Pfeiffer, Franz
Bunk, Oliver
David, Christian
机构：
[1] Siemens AG, Corp Technol, D-81739 Munich, Germany
[2] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany
[3] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2007年 / 78卷 / 09期
关键词：
D O I：
10.1063/1.2786273
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A refractive x-ray lens was characterized using a magnifying cone beam setup for differential phase contrast imaging in combination with a microfocus x-ray tube. Thereby, the differential and the total phase shift of x rays transmitted through the lens were determined. Lens aberrations have been characterized based on these refractive properties. (c) 2007 American Institute of Physics.
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页数：5
相关论文
共 17 条
[1]  
ANKERHOLD U, 2000, PTBDOS34
[2]  
COWLEY JM, 1995, DIFFRACTION PHYS, P21
[3]   Differential x-ray phase contrast imaging using a shearing interferometer [J].
David, C ;
Nöhammer, B ;
Solak, HH ;
Ziegler, E .
APPLIED PHYSICS LETTERS, 2002, 81 (17) :3287-3289
[4]  
ENGELHARDT M, UNPUB J MICROSC
[5]   High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source [J].
Engelhardt, Martin ;
Baumann, Joachim ;
Schuster, Manfred ;
Kottler, Christian ;
Pfeiffer, Franz ;
Bunk, Oliver ;
David, Christian .
APPLIED PHYSICS LETTERS, 2007, 90 (22)
[6]   The partial Talbot effect and its use in measuring the coherence of synchrotron X-rays [J].
Guigay, JP ;
Zabler, S ;
Cloetens, P ;
David, C ;
Mokso, R ;
Schlenker, M .
JOURNAL OF SYNCHROTRON RADIATION, 2004, 11 :476-482
[7]  
Hubbell J. H., TABLES XRAY MASS ATT
[8]   Imaging by parabolic refractive lenses in the hard X-ray range [J].
Lengeler, B ;
Schroer, C ;
Tümmler, J ;
Benner, B ;
Richwin, M ;
Snigirev, A ;
Snigireva, I ;
Drakopoulos, M .
JOURNAL OF SYNCHROTRON RADIATION, 1999, 6 :1153-1167
[9]   A microscope for hard x rays based on parabolic compound refractive lenses [J].
Lengeler, B ;
Schroer, CG ;
Richwin, M ;
Tümmler, J ;
Drakopoulos, M ;
Snigirev, A ;
Snigireva, I .
APPLIED PHYSICS LETTERS, 1999, 74 (26) :3924-3926
[10]   Refractive x-ray lenses [J].
Lengeler, B ;
Schroer, CG ;
Kuhlmann, M ;
Benner, B ;
Guenzler, TF ;
Kurapova, O ;
Zontone, F ;
Snigirev, A ;
Snigireva, I .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (10A) :A218-A222
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