Reduced thermal conductivity of a Ge1-xSnx layer formed on a self-assembled Sn nanodot template

被引:6
作者
Utsumi, Junya [1 ]
Ishimaru, Tomokuni [1 ]
Hayakawa, Yasuhiro [1 ,2 ]
Shimura, Yosuke [1 ,2 ]
机构
[1] Shizuoka Univ, Grad Sch Sci & Technol, Naka Ku, 3-5-1 Johoku, Hamamatsu, Shizuoka 4328011, Japan
[2] Shizuoka Univ, Res Inst Elect, Naka Ku, 3-5-1 Johoku, Hamamatsu, Shizuoka 4328011, Japan
基金
日本学术振兴会;
关键词
thermal conductivity; Ge; Sn; nanodot; PERFORMANCE;
D O I
10.1088/1361-6641/aadc00
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Self-assembled Sn nanodots were formed on SiO2 and the crystallinity and Sn composition of aGe(1-x)Sn(x) polycrystal formed on the Sn nanodots were evaluated. The average diameter of the Sn nanodots was 17.1 nm, and their density was 1.5 x 10(9)cm(-2). Raman spectroscopy revealed that the crystallinity of Ge(1-x)Sn(x )increased from 52.29% to 86.82% as the Ge deposition temperature increased from 100 degrees C to 225 degrees C. However, agglomeration degraded the surface roughness when the Ge deposition temperature was high. By contrast, the Sn composition reduced from 12.84 to 4.78%. For both high Sn composition and a flat surface, lowering the Ge deposition temperature was found to be crucial. The impact of the crystallinity and Sn composition on thermal conductivity was investigated using the time-domain thermoreflectance method. Thermal conductivity increased with the increase in crystallinity, and it reached 2.305 W m(-1)K(-1) for Ge1-xSnx with a crystallinity of 86.82%. Ge1-xSnx alloy had lower thermal conductivity than that of Ge at the same crystallinity.
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页数:7
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