Real-time current testing for A/D converters

被引：10

作者：

Miura, Y

机构：

[1] IEEE, IEEE Computer Society, Inst. Electronics, Info.

[2] Dept. of Electronics and Info. Eng., Tokyo Metropolitan University, Hachioji, Tokyo 192-03

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 02期

关键词：

D O I：

10.1109/54.500199

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The author has revised current testing For analog circuits, examined his method for effective fault detection, and applied it to an A/D converter. This method measures the integral of the power supply current during one clock period in which a test vector is applied. Simulation results show effective detection of target faults in the CUT when applying a step voltage input and easier detection when applying a higher power supply voltage.

引用

页码：34 / 41

页数：8

共 12 条

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[9]

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[10]

Soden J. M., 1992, Journal of Electronic Testing: Theory and Applications, V3, P291, DOI 10.1007/BF00135333

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