Defect density reduction in core layer of ZnTe electro-optical waveguide by low lattice mismatched interfaces

被引:1
作者
Sun, Wei-Che [1 ]
Nakusu, Taizo [1 ]
Odaka, Keisuke [1 ]
Kobayashi, Masakazu [1 ,2 ]
Asahi, Toshiaki [3 ]
机构
[1] Waseda Univ, Dept Elect Engn & Biosci, Shinjuku Ku, 3-4-1 Okubo, Tokyo 1698555, Japan
[2] Waseda Univ, Kagami Mem Res Inst Mat Sci & Technol, Shinjuku Ku, 2-8-26 Nishiwaseda, Tokyo 1690051, Japan
[3] JX Nippon Min & Met Corp, Chiyoda Ku, 1-1-2 Otemachi, Tokyo 1008164, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2017年 / 35卷 / 04期
关键词
DOUBLE-HETEROSTRUCTURE; GROWTH; DESIGN;
D O I
10.1116/1.4984962
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
ZnTe electro-optic waveguide device has a great potential for the practical applications. The introduction of low Mg% cladding layer to the ZnMgTe/ZnTe/ZnMgTe waveguide structure was performed to circumvent the effect of large lattice mismatch between ZnMgTe and ZnTe, and to improve the crystallographic properties. Various two-step index ZnTe waveguide structures were fabricated by molecular beam epitaxy. The structure with 0.1 mu m ( Mg 9%) interlayer and 0.6 mu m ( Mg 26%) cladding layer showed significant defect density reduction compared to the single-step index ZnTe waveguide ( Mg 20%) due the much smaller lattice mismatch between the ZnTe core layer and the ZnMgTe interlayer. However, the average Mg content of ZnMgTe layers needs to be carefully controlled to prevent the drop of the optical confinement. (C) 2017 American Vacuum Society.
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页数:5
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