Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering

被引:5
|
作者
Sell, B. C. [1 ,2 ,3 ]
Ritchey, S. B. [1 ,2 ,3 ]
Yang, S. -H. [4 ]
Parkin, S. S. P. [4 ]
Watanabe, M. [2 ,5 ]
Mun, B. S. [6 ]
Plucinski, L. [2 ,7 ]
Mannella, N. [8 ,9 ,10 ]
Nambu, A. [2 ,11 ]
Guo, J. [9 ]
West, M. W. [2 ]
Salmassi, F. [2 ]
Kortright, J. B. [2 ]
Fadley, C. S. [2 ,7 ,8 ]
机构
[1] Univ Calif Davis, Dept Phys, Davis, CA 95616 USA
[2] Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
[3] Otterbein Coll, Dept Phys, Westerville, OH 43081 USA
[4] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[5] RIKEN Spring8, Sayo, Hyogo 6795148, Japan
[6] Hanyang Univ, Dept Appl Phys, Ansan 426791, Gyeonggi Do, South Korea
[7] Julich Res Ctr, Solid State Phys Res Inst, D-52425 Julich, Germany
[8] Univ Calif Davis, Dept Phys, Davis, CA 95616 USA
[9] Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA
[10] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
[11] Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA
关键词
D O I
10.1063/1.2906331
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate that a standing-wave/wedge (swedge) method for probing buried solid-solid interfaces can be carried out using soft x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS). For the particular case of an Al(2)O(3)/Fe/Cr structure of relevance to giant magnetoresistance, measurements of Fe L and Cr L total intensities and Fe L magnetic circular dichroism are used to derive for both the top and bottom Fe interfaces the depth profile of composition and the depth dependence of the atom-specific Fe contribution to magnetization. Using XES and RIXS in this method, as compared to photoelectron spectroscopy in prior work, permits studying more deeply buried interfaces, and suggests future applications to a wide variety of magnetic and nonmagnetic nanostructures. (c) 2008 American Institute of Physics.
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页数:8
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