Circuit breaker arc model computations for critical line length determination

被引:0
|
作者
Schavemaker, PH [1 ]
van der Sluis, L [1 ]
de Lange, AJP [1 ]
机构
[1] Delft Univ Technol, Power Syst Lab, Delft, Netherlands
关键词
circuit breaker; arc model; digital testing; short-line fault; artificial line; critical line length;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
One of the most severe faults for a circuit breaker to interrupt is the Short-Line Fault (SLF). In this paper, digital testing is applied to determine the critical line length, i.e, the short-line fault percentage that stresses the circuit breaker most, for three different circuit breakers. Three are models have been used for the calculations and three indicators have been applied to determine the stress on the breaker. From comprehensive computations it appears that an SLF percentage higher than 90% is the most severe for the circuit breakers to interrupt.
引用
收藏
页码:915 / 920
页数:6
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