Enhanced roughness of lipid membranes caused by external electric fields

被引：2
|
作者：
Neek-Amal, M. [1 ]
Raffi-Tabar, H. [1 ,2 ]
Sepangi, H. R. [1 ,3 ]
机构：
[1] Inst Studies Theoret Phys & Math, Dept Nano Sci, Tehran, Iran
[2] Shahid Beheshti Univ Med Sci, Dept Med Phys & Biomed Engn, Tehran, Iran
[3] Shahid Beheshti Univ Med Sci, Dept Phys, Tehran 19839, Iran
来源：
COMPUTATIONAL MATERIALS SCIENCE | 2007年 / 41卷 / 02期
关键词：
lipid membrane roughness; Canham-Helfrich Hamiltonian; surface tension; bending rigidity;
D O I：
10.1016/j.commatsci.2007.03.017
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The behavior of lipid membranes in the presence of an external electric field is studied and used to examine the influence of such fields on membrane parameters such as roughness and show that for a micro sized membrane, roughness grows as the field increases. The dependence of bending rigidity on the electric field is also studied and an estimation of thickness of the accumulated charges around lipid membranes in a free-salt solution is presented. Crown Copyright (c) 2007 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码：202 / 207
页数：6
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