Characteristics of ZrC/ZrN and ZrC/TiN multilayers grown by pulsed laser deposition

被引:31
作者
Craciun, D. [1 ]
Bourne, G. [2 ]
Socol, G. [1 ]
Stefan, N. [1 ]
Dorcioman, G. [1 ]
Lambers, E. [2 ]
Craciun, V. [1 ,2 ]
机构
[1] Natl Inst Laser Plasma & Radiat Phys, Laser Dept, Bucharest, Romania
[2] Univ Florida, Major Analyt Instrumentat Ctr, Gainesville, FL 32611 USA
关键词
ZrC; ZrN; TiN; Pulsed laser deposition; Thin films; Multilayers; ZRC THIN-FILMS; X-RAYS; COATINGS; HARDNESS; CARBIDE; MICROSTRUCTURE; ROUTES; ARRAYS; TIN;
D O I
10.1016/j.apsusc.2010.11.106
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
ZrC/ZrN and ZrC/TiN multilayers were grown on (100) Si substrates at 300 degrees C by the pulsed laser deposition (PLD) technique using a KrF excimer laser. X-ray diffraction investigations showed that films were crystalline, the strain and grain size depending on the nature and pressure of the gas used during deposition. The elemental composition, analyzed by Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS), showed that films contained a low level of oxygen contamination. Simulations of the X-ray reflectivity (XRR) curves acquired from films indicated a smooth surface morphology, with roughness below 1 nm (rms) and densities very close to bulk values. Nanoindentation results showed that the ZrC/ZrN and ZrC/TiN multilayer samples exhibited hardness values between 30 and 33 GPa, slightly higher than the values of 28-30 GPa measured for pure ZrC, TiN and ZrN films. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:5332 / 5336
页数:5
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