CUMULATION OF A HIGH-CURRENT ELECTRON BEAM DURING A NANOSECOND HIGH-VOLTAGE DISCHARGE IN A LOW-PRESSURE DIODE

被引：0

作者：

Lomaev, M. I. ^{[1
,2
]}

Tarasenko, V. F. ^{[1
,2
]}

Dyatlov, A. V. ^{[2
]}

机构：

[1] Russian Acad Sci, Inst High Current Elect, Siberian Branch, Tomsk, Russia

[2] Natl Res Tomsk Polytech Univ, Tomsk, Russia

来源：

RUSSIAN PHYSICS JOURNAL | 2019年 / 62卷 / 06期

关键词：

electron beam cumulation effect; runaway electrons; high-voltage nanosecond discharge; VACUUM; AIR;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The results of an experimental investigation of the effect of cumulation of a beam of runaway electrons formed in a high-voltage nanosecond discharge at a reduced air pressure are presented. The optimal conditions of this effect in a discharge gap in a tubular cathode - grounded planar anode geometry were achieved at an air pressure of approximate to 5 Pa and an interelectrode gap of 2.75 mm. An electron-beam current pulse is recorded with a high time resolution (up to about 80 ps) behind the flat foil anode. It is found out that due to this effect a through hole is formed in a 20 mu m-thick aluminum foil after 2-3 discharge pulses. The results obtained suggest that the electron energy in the second part of the beam current pulse is lower than that in its first part.

引用

页码：996 / 1000

页数：5

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