Fabrication of a Nb-Doped β-Ga2O3 Nanobelt Field-Effect Transistor and Its Low-Temperature Behavior

被引:27
作者
Chen, Jin-Xin [1 ]
Li, Xiao-Xi [1 ]
Tao, Jia-Jia [1 ]
Cui, Hui-Yuan [2 ]
Huang, Wei [1 ]
Ji, Zhi-Gang [3 ]
Sai, Qing-Lin [2 ]
Xia, Chang-Tai [2 ]
Lu, Hong-Liang [1 ]
Zhang, David Wei [1 ]
机构
[1] Fudan Univ, Shanghai Inst Intelligent Elect & Syst, Sch Microelect, State Key Lab ASIC & Syst, Shanghai 200433, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
[3] Shanghai Jiao Tong Univ, Natl Key Lab Sci & Technol Micro Nano Fabricat, Shanghai 200240, Peoples R China
基金
上海市自然科学基金; 中国国家自然科学基金;
关键词
well-behaved; gallium oxide; field-effect transistors; Nb-doped; temperature dependence; harsh environment; SINGLE-CRYSTALS; TRANSPARENT; GROWTH; POWER; EDGE;
D O I
10.1021/acsami.9b20499
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
For the first time, we report the successful fabrication of well-behaved field-effect transistors based on Nb-doped beta-Ga2O3 nanobelts mechanically exfoliated from bulk single crystals. The exfoliated beta-Ga2O3 nanobelts were transferred onto a purified surface of the 110 nm SiO2/Si substrate. These Nb-doped devices showed excellent electrical performance such as an ultrasmall cutoff current of similar to 10 fA, a high current on/off ratio of >10(8), and a quite steep subthreshold swing (SS, similar to 120 mV/decade). Furthermore, we investigated the temperature dependence down to 200 K, providing insightful information for its operation in a harsh environment. This work lays a foundation for wider application of Nb-doped beta-Ga2O3 in nano-electronics.
引用
收藏
页码:8437 / 8445
页数:9
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