semiconductor device;
strongly A(0)-stable;
multistep methods;
finite element methods;
mixed finite element methods;
D O I:
10.1016/S0252-9602(17)30347-8
中图分类号:
O1 [数学];
学科分类号:
0701 ;
070101 ;
摘要:
The transient behavior of a semiconductor device consists of a Poisson equation for the electric potential and of two nonlinear parabolic equations for the electron density and hole density. The electric potential equation is discretized by a mixed finite element method.. The electron and hole density equations axe treated by implicit-explicit multistep finite element methods. The schemes axe very efficient. The optimal order error estimates both in time and space are derived.