The Performance of Silicon Solar Cell with Different Anti-Reflection Coating Processes

被引：1

作者：

Aziz, Wisam J. ^{[1
]}

Ibrahim, K. ^{[1
]}

机构：

[1] Univ Sains Malaysia, Sch Phys, Nanooptoelect Res & Technol Lab, Usm 11800, Penang, Malaysia

来源：

PROGRESS OF PHYSICS RESEARCH IN MALAYSIA, PERFIK2009 | 2010年 / 1250卷

关键词：

Anti-reflection coating; Porous silicon; Solar cells; High efficiency; INDEX;

D O I：

10.1063/1.3469741

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A solar cell has been fabricated by different anti-reflection coating methods, ZnO/SiO(2), TiO(2)/SiO(2) and porous silicon. Surface morphology and structural properties of nanostructured silicon were characterized by using scanning electron microscopy (SEM) and atomic forces microscopy (AFM) images. Optical reflectance was obtained by using optical reflectometer (Filmetrics-F20). Current-Voltage (I-V) measurements of the fabricated solar cell were taken under 80 mW/cm2 illumination conditions. The results showed the porous silicon an excellent reduction anti-reflection coating for reflection incident light compare with a different anti-reflection coating processes as well as a good light-trapping of wide wavelength spectrum which led to produce a solar cells high efficiency.

引用

页码：89 / 92

页数：4

共 5 条

[1] Photovoltaic device applications of porous microcrystalline silicon [J].

Duttagupta, SP ;

Fauchet, PM ;

Ribes, AC ;

Tiedje, HF ;

Damaskinos, S ;

Dixon, TE ;

Brodie, DE ;

Kurinec, SK .

SOLAR ENERGY MATERIALS AND SOLAR CELLS, 1998, 52 (3-4) :271-283

[2] Morphological, optical and electrical characterization of antireflective porous silicon coatings for solar cells [J].

Martín-Palma, RJ ;

Vázquez, L ;

Herrero, P ;

Martínez-Duart, JM ;

Schnell, M ;

Schaefer, S .

OPTICAL MATERIALS, 2001, 17 (1-2) :75-78

[3]

SCHIRONE L, 1997, P 14 EUR PV SOL EN C, P1479

[4] COATING DESIGN USING VERY THIN HIGH-INDEX AND LOW-INDEX LAYERS [J].

SOUTHWELL, WH .

APPLIED OPTICS, 1985, 24 (04) :457-460

[5] Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection [J].

Xi, J.-Q. ;

Schubert, Martin F. ;

Kim, Jong Kyu ;

Schubert, E. Fred ;

Chen, Minfeng ;

Lin, Shawn-Yu ;

Liu, W. ;

Smart, J. A. .

NATURE PHOTONICS, 2007, 1 (03) :176-179

← 1 →