Perpendicular magnetic anisotropy in ultrathin Co|Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy

被引：20

作者：

Macia, F. ^{[1
]}

Warnicke, P. ^{[2
]}

Bedau, D. ^{[1
]}

Im, M. -Y. ^{[3
]}

Fischer, P. ^{[3
]}

Arena, D. A. ^{[2
]}

Kent, A. D. ^{[1
]}

机构：

[1] NYU, Dept Phys, New York, NY 10003 USA

[2] Brookhaven Natl Lab, Natl Synchrotron Light Source, Upton, NY 11973 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2012年 / 324卷 / 22期

关键词：

Perpendicular magnetic anisotropy; Domain imaging; Ferromagnetic resonance (FMR); X-ray microscopy; X-ray magnetic circular dichorism; DOMAIN-STRUCTURE; REVERSAL;

D O I：

10.1016/j.jmmm.2012.03.063

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L-3 edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film. (C) 2012 Elsevier BY. All rights reserved.

引用

页码：3629 / 3632

页数：4

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