A method of improving spatial resolution in X-ray fluorescence holography

被引:2
|
作者
Xie, HL [1 ]
Chen, JW [1 ]
Gao, HY [1 ]
Xiong, SS [1 ]
Xu, ZZ [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
来源
OPTIK | 2003年 / 114卷 / 07期
关键词
X-ray flourescence holography; single crystal; synchrotron radiation; Fourier transform; structural analysis;
D O I
10.1078/0030-4026-00268
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
X-ray fluorescence holography (XFH) is a promising method for determination three-dimensional (3D) structure of local atoms. In this paper, we propose a method to improve the resolution of reconstructed atomic images in x-ray fluorescence holography. A Fe single crystal of body-centred lattice was used as a model for calculation of a hologram. Angular range dependence on spatial resolution of atomic images is discussed. The spatial resolution of the reconstructed image is proportional to the size of the hologram. A hologram recorded in the full 4pi sphere can provide complete holographic information. On the other hand, an atomic image obtained from a single energy XFH appears many aberrations and artifacts. By summing images reconstructed from the holograms recorded at several different energies, the atomic image became clearer. Furthermore, the spatial resolution of the atomic image increases with increase in the incident energy. And, the wider the range of incident energy is, the fewer aberrations and artifacts are. So, if an X-ray fluorescence hologram are recorded with the high incident energy and wide multiple-energy range in a 4pi solid angle, the atomic images can be reconstructed from the hologram with a high spatial resolution.
引用
收藏
页码:317 / 321
页数:5
相关论文
共 50 条
  • [31] Inverse Fourier analysis in x-ray fluorescence holography
    Hayashi, K
    PHYSICAL REVIEW B, 2005, 71 (22)
  • [32] Applications of X-ray Fluorescence Holography to Materials Sciences
    Hosokawa, Shinya
    Ozaki, Toru
    Happo, Naohisa
    Hayashi, Kouichi
    E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY, 2011, 9 : 265 - 272
  • [33] Development of laboratory x-ray fluorescence holography equipment
    Yukio Takahashi
    Kouichi Hayashi
    Kimio Wakoh
    Naomi Nishiki
    Eiichiro Matsubara
    Journal of Materials Research, 2003, 18 : 1471 - 1473
  • [34] Applications of X-ray fluorescence holography to materials sciences
    Hosokawa, Shinya
    Ozaki, Toru
    Happo, Naohisa
    Hayashi, Kouichi
    e-Journal of Surface Science and Nanotechnology, 2011, 9 : 265 - 272
  • [35] Simulation studies of atomic resolution X-ray holography
    Yogesh Kashyap
    P. S. Sarkar
    Amar Sinha
    B. K. Godwal
    Bulletin of Materials Science, 2004, 27 : 79 - 84
  • [36] Simulation studies of atomic resolution X-ray holography
    Kashyap, Y
    Sarkar, PS
    Sinha, A
    Godwal, BK
    BULLETIN OF MATERIALS SCIENCE, 2004, 27 (01) : 79 - 84
  • [37] X-ray image holography with 60 nm resolution
    Gao, H
    Chen, J
    Xie, H
    Jiang, S
    Zhu, P
    Lu, P
    Xu, Z
    JOURNAL DE PHYSIQUE IV, 2003, 104 : 583 - 586
  • [38] Effect of recording methods on resolution in X-ray holography
    Zhu, Peiping
    Chen, Jianwen
    Xu, Zhizhan
    Guangxue Xuebao/Acta Optica Sinica, 1993, 13 (08): : 717 - 722
  • [39] Soft x-ray laser holography with wavelength resolution
    Wachulak, P. W.
    Marconi, M. C.
    Bartels, R. A.
    Menoni, C. S.
    Rocca, J. J.
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2008, 25 (11) : 1811 - 1814
  • [40] Atomic-Resolution X-Ray Fluorescence Holography of Zn (0.02 wt%) in a GaAs Wafer
    Kouichi Hayashi
    Tokujirou Yamamoto
    Jun Kawai
    Motohiro Suzuki
    Shunji Goto
    Shinjiro Hayakawa
    Kenji Sakurai
    Yohichi Gohshi
    Analytical Sciences, 1998, 14 : 987 - 990