OSL Diagnostics of Luminescent Materials in a Scanning Electron Microscope

被引：0

作者：

Vokhmintsev, A. S. ^{[1
]}

Weinstein, I. A. ^{[1
]}

Karabanalov, M. S. ^{[1
]}

Smorodinskii, Ya. G. ^{[2
]}

机构：

[1] Ural Fed Univ, Ekaterinburg, Russia

[2] Russian Acad Sci, Ural Branch, Inst Phys Met, Ekaterinburg, Russia

来源：

RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING | 2014年 / 50卷 / 12期

关键词：

optically stimulated luminescence; spatially resolved luminescence; SEM; alpha-Al2O3; CATHODOLUMINESCENCE;

D O I：

10.1134/S1061830914120109

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The principles for the application of methods of optically stimulated luminescence (OSL) in a scanning electron microscope (SEM) were developed in this work. A functional scheme for a diagnostic OSL attachment for the investigation of the local properties and distribution parameters of optically active structure complexes in wide-gap dosimeter materials was proposed. Analysis of the dependencies of OSL on the variation in the size of regions that are irradiated with electrons was conducted with anion-defective alpha-Al2O3 singlecrystals as an example. The possibility of OSL diagnostics of the surface of solid luminescent media and functional matrices with a microscale spatial resolution was shown.

引用

页码：736 / 740

页数：5

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