High resolution X-ray diffraction studies on hexaphenyl thin films

被引：25

作者：

Resel, R ^{[1
]}

Leising, G ^{[1
]}

机构：

[1] Graz Univ, Inst Festkorperphys, A-8010 Graz, Austria

来源：

SURFACE SCIENCE | 1998年 / 409卷 / 02期

基金：

奥地利科学基金会;

关键词：

aromatics; crystalline-amorphous interfaces; crystallisation; X-ray diffraction;

D O I：

10.1016/S0039-6028(98)00230-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The direction of the preferred growth of hexaphenyl crystallites within thin films can be adjusted by varying the sample preparation conditions. Two types of samples with different preferred growth are investigated by Theta/2 Theta scans at different tilt angles psi, the preferred growth are characterised by either (00l) or (22-3) planes of hexaphenyl crystallites parallel to the surface of the substrate. In both types of preferred growth the crystallites are highly ordered, the misalignment of the (001) and (22-3) planes relative to the surface of the substrate is within a few degrees. The two types of preferred growth are explained by layer growth of hexaphenyl molecules, the layers are parallel to the surface of the substrate. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：302 / 306

页数：5

共 17 条

[1] Structural studies of parasexiphenyl thin films: Importance of the deposition parameters [J].