Characteristics and effects of interfacial interdiffusion in composite multilayer ceramic capacitors

被引：9

作者：

Zuo, RZ ^{[1
]}

Li, LT ^{[1
]}

Tang, Y ^{[1
]}

Gui, ZL ^{[1
]}

机构：

[1] Tsing Hua Univ, State Key Lab New Ceram & Fine Proc, Dept Mat Sci & Engn, Beijing 100084, Peoples R China

来源：

MATERIALS CHEMISTRY AND PHYSICS | 2001年 / 69卷 / 1-3期

基金：

中国国家自然科学基金;

关键词：

interface; diffusion; multilayer; ceramic; dielectric properties;

D O I：

10.1016/S0254-0584(00)00399-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Back-scattering (BS), second-electron image and energy dispersive X-ray (EDX) were used to investigate the reciprocal diffusion at the heterogeneous interfaces in composite multilayer ceramic capacitors (CMLCCs). It was found that a phenomenon of an evident interdiffusion existed at the interface of CMLCCs. The characteristics and effects of interdiffusion for different elements were studied in detail. The results obtained showed that silver diffusion was a typically physical migration, which can be mainly controlled by the sintering characteristics of the ceramics. Before the open pores on the surface of the ceramics disappear, the silver can diffuse mainly through the vapor phase, based on an evaporization-condensation mass transport principle. In addition, the diffusion between different ceramic dielectrics, such as Mg) Zn, and Ni, can be affected by the sintering temperature and time, and particularly by compositional gradients. In this paper, the effects of interdiffusion on dielectric properties and reliability of CMLCCs were also discussed. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：230 / 235

页数：6

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