共 13 条
[4]
Johnson M, 2005, STUD APPL ELECTROMAG, V25, P135
[5]
Konoplyuk S., 2005, J NONDESTR TEST EVAL
[8]
Metcalfe G. R, 1990, NDT TECHN AER IEE C
[10]
Smith RA, 2001, INSIGHT, V43, P14