Two-dimensional mapping of chemical information at atomic resolution

被引：215
作者：
Bosman, M. [1 ]
Keast, V. J.
Garcia-Munoz, J. L.
D'Alfonso, A. J.
Findlay, S. D.
Allen, L. J.
机构：
[1] Univ Sydney, Electron Microscope Unit, Sydney, NSW 2006, Australia
[2] Univ Newcastle, Sch Math & Phys Sci, Newcastle, NSW 2308, Australia
[3] CSIC, Inst Ciencia Mat Barcelona, E-08193 Barcelona, Spain
[4] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia
来源：
PHYSICAL REVIEW LETTERS | 2007年 / 99卷 / 08期
基金：
英国工程与自然科学研究理事会;
关键词：
D O I：
10.1103/PhysRevLett.99.086102
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into the connection between form and function in materials science and nanotechnology. We demonstrate structural and chemical mapping in Bi0.5Sr0.5MnO3 using an aberration-corrected scanning transmission electron microscope. Two-dimensional mapping is made possible by an adapted method for fast acquisition of electron energy-loss spectra. The experimental data are supported by simulations, which help to explain the less intuitive features.
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页数：4
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