Conductive copper sulfide thin films on polyimide foils for optical and optoelectronic applications

被引:9
|
作者
Cardoso, J
Gomez-Daza, O
Ixtlilco, L
Nair, MTS
Nair, PK
机构
[1] Univ Autonoma Metropolitana Iztapalapa, Dept Phys, Mexico City 09340, DF, Mexico
[2] Univ Nacl Autonoma Mexico, CIE, Dept Solar Energy Mat, Temixco 62580, Morelos, Mexico
来源
MODERN PHYSICS LETTERS B | 2001年 / 15卷 / 17-19期
关键词
D O I
10.1142/S0217984901002518
中图分类号
O59 [应用物理学];
学科分类号
摘要
Copper sulfide thin films of 75 nm and 100 mn thickness were coated on Kapton foils (PI) of 25 mn thickness by floating them on a chemical bath. The foils were annealed at 150 degreesC-400 degreesC in N-2 converting the coating from CuS to Cu1.8S. The sheet resistance of the annealed coatings (100 nm) is 10-50 ohms/square which is almost unaltered after immersion in dilute HCl for 30-120 min. The infrared reflectance predicted for the coatings is 67%-77% at a wavelength 2.5 mum, which is nearly what is experimentally observed. The coated PI has a transmittance (25-35%) peak located around 550-600 nm. These thermally stable conductive coatings on PI foils might be used as conductive substrates for optoelectronic device structures.
引用
收藏
页码:774 / 777
页数:4
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