THz Bandwidth InP HBT Technologies and Heterogeneous Integration with Si CMOS

被引:0
|
作者
Urteaga, M. [1 ]
Carter, A. [1 ]
Griffith, Z. [1 ]
Pierson, R. [1 ]
Bergman, J. [1 ]
Arias, A. [1 ]
Rowell, P. [1 ]
Hacker, J. [1 ]
Brar, B. [1 ]
Rodwell, M. J. W. [2 ]
机构
[1] Teledyne Sci Co, Thousand Oaks, CA 91360 USA
[2] Univ Calif Santa Barbara, Dept ECE, Santa Barbara, CA 93106 USA
关键词
Indium Phosphide; HBT; terahertz; heterogeneous integration;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Through aggressive lithographical and epitaxial scaling, the bandwidths of InP-based heterojunction bipolar transistors have been extended to THz frequencies. At 130nm emitter dimensions, transistors with maximum frequencies of oscillation (f(max)) of > lTHz have been demonstrated with accompanying circuit demonstrations at 670GHz. At 250nm emitter dimensions, high efficiency and high power density mm-wave power amplifiers covering E-band (71GHz) to G-band (235GHz) have been fabricated. The utility of these high performance transistors can be further enhanced through heterogeneous integration with Si CMOS. We have demonstrated wafer-scale 3D integration of InP and Si using a low temperature oxide-to-oxide bonding process with embedded Cu interconnects.
引用
收藏
页码:35 / 41
页数:7
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