Near-field photoluminescence of microcrystalline arsenic oxides produced in anodically processed gallium arsenide

被引:23
作者
Finnie, CM
Bohn, PW [1 ]
机构
[1] Univ Illinois, Beckman Inst, Dept Chem, Urbana, IL 61801 USA
[2] Univ Illinois, Mat Res Lab, Urbana, IL 61801 USA
关键词
D O I
10.1063/1.123454
中图分类号
O59 [应用物理学];
学科分类号
摘要
Anodic processing of (100) GaAs in aqueous HCl results in the formation of a pitted surface hosting arsenic oxide microcrystals within a porous surface network. The composition of the microcrystalline features evolves from As(V) to As(III) with processing time. Spatially localized near-field photoluminescence (PL) spectroscopy of the microcrystalline and porous features demonstrates that the strong visible photoluminescence observed in the far field originates from the mu m-sized crystalline features. The spatial localization of the PL on the arsenic oxide microcrystalline features argues that it does not arise from quantum confinement effects, but rather is due to luminescent features intrinsic to the arsenic oxide microcrystals on the pitted surface. (C) 1999 American Institute of Physics. [S0003-6951(99)00904-3].
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页码:1096 / 1098
页数:3
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