Dissipation due to two-level systems in nano-mechanical devices

被引：36
|
作者：
Seoanez, C.
Guinea, F.
Castro Neto, A. H.
机构：
[1] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain
[2] Harvard Univ, Dept Phys, Cambridge, MA 02138 USA
[3] Boston Univ, Dept Phys, Boston, MA 02215 USA
来源：
EPL | 2007年 / 78卷 / 06期
关键词：
D O I：
10.1209/0295-5075/78/60002
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We analyze the dissipation of the vibrations of nano- mechanical devices. We show that. the coupling between flexural modes and two-level systems leads to sub-ohmic dissipation. The inverse quality factor of the flexural modes of low frequencies depends on temperature as Q(-1)(T) approximate to Q(0) + CT1/3, providing a quantitative description of the experimental data. Copyright (C) EPLA, 2007
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页数：6
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